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Microstructural Characterization of Materials, 2nd Edition offers a comprehensive insight into the methods used to assess the intricate microstructure of engineering materials. By examining interactions between various probes - such as visible light, X-rays, high-energy electron beams, and scanning probe techniques - and meticulously prepared specimens, the book guides you through both the qualitative and quantitative aspects of material analysis. Structured around the key areas of crystal structure, microstructural morphology, and microanalysis, this second edition builds on its predecessor with expanded coverage. New chapters explore surface probe microscopy and introduce innovative sections on digital image recording and analysis, orientation imaging microscopy, focused ion-beam instruments, atom-probe microscopy, and three-dimensional image reconstruction. Ideal for advanced undergraduates, graduate students, and established researchers in material science, materials engineering, and materials chemistry, this edition provides a robust and detailed framework for understanding and applying microstructural characterization techniques.
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